System Integration & Reliable Interconnects Lab
Research Field
Chun-Hao Chen received his Ph.D. degree from the National Taiwan University, Taipei, Taiwan. He was the researcher at Fraunhofer Institute for Reliability and Microintegration IZM, Berlin, Germany. He is now the Assistant Professor of the International College of Semiconductor Technology at National Yang Ming Chiao Tung University. His research interests include IC bonding wire, soldering, and power electronic packaging.
SIRI Lab, short for System Integration & Reliable Interconnects, is dedicated to semiconductor packaging and system integration. The SIRI Lab at NYCU focuses on advanced research and development in the field of semiconductor packaging, system integration, and reliable interconnect technologies. By exploring next-generation compound semiconductor packaging methods, and robust interconnect designs, the lab strives to address challenges in high-performance and energy-efficient electronic systems.
- Electronic Packaging for Micro- & Power Electronic Packaging –Interconnection Technology
- Reliability tests for Electronic Packaging – Passive Tests and Active Power Cycling
- Interfacial Reaction (Similar/Dissimilar metallic bonding)
- Materials Fractography and Failure Analysis
2020 Postdoctoral Research Abroad Program (MOST)
2019 DAAD Research Grants – Short-Term Grants
2019 Graduate Students Study Abroad Program (MOST)
2015-2020 Ph. D. Department of Materials Science and Engineering, National Taiwan University
2013-2015 M.S. Department of Materials Science and Engineering, National Taiwan University
2008-2013 B.S. Department of Materials Science and Engineering, National Cheng Kung University